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Signal Analysis of THD+N with dB3000S
Introduction
Lavry Engineering's latest revision to the Model 3000S Sample-Rate Data
Format Converter consists of THD+N (total harmonic distortion and noise)
measurement capabilities. The new function expands the usefulness of this
"digital audio all in one tool". The new feature offers the high performance
and ease of use found in all the other features (data format conversion,
sample rate conversion, Acoustic Bit Correction ,
reference meter bridge and test tone generation). 24 bit tone generation
and THD+N measurement accuracy in excess of 122ÝdB provide sufficient
margin for the next generation of digital audio equipment.
The Model 3000S's test tone generation and Signal analysis are independent
of each other. This flexibility allows performing either function separately
or both simultaneously. Distortion and noise
Real hardware generated tones contain both distortion and noise. Harmonic
distortion is referred to as energy residing at multiples of the tone
frequency. Noise is all other undesirable energy.
Some common sources of distortion:
* Amplifiers: non linear signal processing causes distortion. While mostly
corrected for by use of negative feedback, amplifiers tend to degrade
at higher frequencies.
* Component imperfection: distortions occur when component values depend
on the signal. For example, capacitors tend to counteract a changing signal
(dielectric absorption).
* Digital truncation: limitations of word length (number of bits) is a
non linear process. Such distortions increase at lower signal levels.
By definition, noise is not all random (tones occurring at non harmonic
frequencies are considered noise). Well known and understood is the critical
noise requirement associated with signal amplification. Often overlooked
is the accumulated noise due to connecting of many units in series.
Common sources of random noise:
* Resistor noise (flat frequency distribution) increases for larger value
of resistance.
* Semiconductor noise, mostly flat frequency distribution. Increased noise
levels at very low frequencies usually occurs below audible frequencies.
* Capacitor noise, inconsequential for higher values, has become a performance
limiting factor with the introduction of very small capacitor values incorporated
in modern semiconductors such as oversampling sigma delta converters.
* Digital truncation: limitations of word length (number of bits) in A/D
converters, signal processors and more. The problem grows with increased
amount of processing. Common sources of non-random noise:
* Coupling to analog signal path: AC power line, RFI/EMI, coupling of
digital signals to analog path, inadequate power supply rails and more.
* Digital truncation: limitations of word length (number of bits) in A/D
converters, signal processors and more. The problem increases for low
level signals.
* Limit cycles: cyclical patterns behavior in feedback based digital signal
processing (such as sigma delta converters and IIR filter structures).
Listening tests and measurement of individual equipment in the audio chain
does not guarantee optimum THD+N performance. Setup optimization is a
very complex subject. Top recording engineers blend artistic considerations
and engineering know-how into the process. The following discussion does
not deal with artistic aspects. We acknowledge the great importance of
artistry in music production, but are bound to limit our discussion to
measurable and objective phenomena.
Optimizing THD+N (some engineering considerations):
Analog amplification: good signal to noise ratio requires "early" signal
amplification, but with careful attention to tradeoffs between distortions
and noise.
Analog attenuation: undesirable from noise standpoint, may be required
to accommodate signal range limitations of various gear.
Jitter: clock jitter in A/D, D/A and Sample Rate Converters degrades THD+N.
Reference D/A clock jitter in a studio may have little to do with the
end product quality, but may make the monitoring process difficult. Sample
rate converters perform best with low jitter on both incoming and outgoing
clocks.
Configuring proper digital chain: whenever unit A may drive unit B or
visa versa. A good "rule of thumb" is to have the better performer drive
the lower performer. A quality digital device utilizing 24 bit words is
limited to 16 bits when driven by a 16 bit device. The compounded outcome
is that of "2 x 16 bit devices". Reversing the order allows the first
process to retain its high accuracy, leaving a compounded outcome of one
16 bit device.
Measuring THD+N
The common method for measuring THD+N is based on feeding a "device under
test" with a quality reference test tone and measuring the undesirable
energy (THD+N) at its output. Lavry Engineering's Model 3000S provides
the user with a reference test tone. The processed tone (or any other
source) may be fed back to Model 3000S input. The input signal is filtered
by a very sharp notch to separate the desired signal component from the
undesirable energy (THD+N). The undesirable energy (THD+N) is then displayed
inÝdB (referenced to full scale).
The notch filter must be very deep and narrow. Notch depth assures that
no energy at the fundamental frequency "leaks" to the meter. Narrow notch
is required to leave noise and harmonics intact. How steep should the
notch be? For theoretical tones one may strive for the steepest notch
possible. Real applications require full attenuation over a slightly wider
frequency range to accommodate possible small jitter of both sampling
clock and the tone itself. Model 3000S provides sufficient attenuation
over about .1% (allowing about 20 nsec jitter).
Additional 20 Hz high pass filtering ensures that very low frequency components
(such as DC and other low frequency inaudible energy) does not alter the
outcome.
Model 3000S begins its measurement by locking to the test tone frequency.
There are 2 modes (user selectable) for achieving lock:
* Auto mode: Proper locking in the presence of noise and distortion requires
"reasonable" signal to noise and distortion ratio. When using Auto mode
we recommend starting the test with a large enough signal (full scale
signals are ideal, but locking will take place at 40ÝdB over the
noise and distortions floor). Pressing the "Go" button sets the notch
in place, allowing THD+N measurements at any level.
* Normal mode: when using Model 3000S tone generator, the notch frequency
follows the tone frequency settings. Normal mode frees the lock mechanism
from any signal to noise restrictions. This mode requires the tone sample
rate and incoming signal sample rate to match within +/- .1% of each other
(testing Sample rate converters requires Auto mode).
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